Watanabe T., Maeda T., Mimura M., Ohashi Y., Hirabayashi I.(hirazum@istec.or.jp)
Selvamanickam V., Hatzistergos M.S., Efstathiadis H.(hefstathiadis@uamail.albany.edu), Lifshin E., Kaloyeros A.E., Reeves J.L., Allen L.P.(lallen@epion.com), MacCrimmon R.
Ключевые слова: HTS, YBCO, coated conductors, substrate SrTiO3, MOCVD process, microstructure, critical current density, critical caracteristics, fabrication
Iijima Y., Nakamura Y., Saitoh T., Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Honjo T.
Ключевые слова: HTS, YBCO, coated conductors, MOD process, microstructure, critical current density, fabrication, critical caracteristics
Iijima Y., Shiohara Y., Aoki Y., Hasegawa T., Watanabe T., Maeda T., Honjo T., Yamada Y., Saito T., Hirabayashi I., Takahashi Y.*(k920112@sntl.swcc.co.jp))
Freyhardt H.C., Eickemeyer J., Donet S., Weiss F.(Francois.Weiss@inpg.fr), Chaudouet P., Beauquis S., Abrutis A., Usokin A.(usokin@umpsun1.gwdg.de), Selbmann D., Jimenez C.(jimenez@jipelec.com), Bruzek C.E.(Christian_Eric.Bruzek@nexans.com), Saugrain J.M.
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, reel-to-reel process, substrate Ni, critical current density, fabrication, critical caracteristics
Osamura K., Ono T., Hirabayashi I., Matsumoto K., Takechi A.(takechi@kumax.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, cap layers, PLD process, microstructure, critical current density, fabrication, critical caracteristics
Osamura K., Matsumoto K., Takechi A.(takechi@sd6.so-net.ne.jp)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, substrate SrTiO3, PLD process, critical current density, fabrication, critical caracteristics
Mannhart J.(jochen.mannhart@physik.uni-augsburg.de), Hammerl, G., Bielefeldt, H., Leitenmeier, S., Schmehl, A., A., Weber, Schneider, C.W.
Ключевые слова: HTS, coated conductors, grain alignment, critical current density, numerical analysis, critical caracteristics
Akin Y., Hascicek Y.S., Aslanoglu Z., Okuyucu H.(okuyucu@gazi.edu.tr), Arda L., Heiba Z.K.(zein_kh@hotmail.com), El-Kawni M.I.(elkawani@magnet.fsu.edu), Tolliver J.C., Barnes P.N.
Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Dorris S.E., Miller D.J., Balachandran U., Meiya L., Beihai M.(bma@anl.gov)
Qiao Y., Reeves J., Lenseth K., Selvamanickam V., Zdun K., Xie J., Hope L., Yijie L.(yli@igc.com), Corcoran S.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, microstructure, critical current density, fabrication, critical caracteristics
Stavrev S.(svetlomir.stavrev@epfl.ch), Dutoit B.(bertrand.dutoit@epfl.ch), Grilli F.(francesco.grilli@epfl.ch)
Ключевые слова: HTS, Bi2223/Ag, wires, tapes, critical current, critical current density, anisotropy, numerical analysis, critical caracteristics
Goyal A., Paranthaman M., Verebelyi D.T., Ekin J.W., Clickner C.C., Feenstra R., Cheggour N., Thieme C.L.H.
Ключевые слова: LTS, Nb3Sn, cables, ac losses, critical current density, magnets, ITER, power equipment, critical caracteristics
Varesi E., Petrisor T., Boffa V., Ciontea L., Galluzzi V., Gambardella U., Mancini A., Rufoloni A., Vannozzi A., Celentano G.
Kreiskott S., Polak M., Demencik E., Krempasky L., Wehler D., Moenter B.(moenter@uni-wuppertal.de), Polyanskii A., Larbalestier D.C.(larbales@cae.wisc.edu)
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